XRY Advanced Acquisition | Training
Mon, 13 Jun
|New Delhi
Extract data from Mobile devices when traditional forensic tools are no longer an option.
Time & Location
13 Jun 2022, 10:00 am IST – 17 Jun 2022, 6:00 pm IST
New Delhi, Crown Plaza, Okhla Phase I, Okhla Industrial Estate, New Delhi, Delhi 110020, India
About the event
Cyint Technologies brings to you MSAB XRY Advanced Acquisition training.
The Advanced Acquisition course focusses on helping you learn new ways to secure the data. We teach you how to extract data from mobile devices when traditional forensic tools are no longer an option. This training will take you to the next level of knowledge and understanding for mobile forensics. This course focuses on the extraction and recovery of data via JTAG and Chip Off methods, you will receive soldering practical experience and learn how to decrypt recovered data. This practical knowledge is invaluable when automatic dumping and decoding is no longer an option.
As one of the more advanced training courses, this class covers all elements of knowledge required to maximize your productivity and expertise. If you have been using XRY for quite some time and want to demonstrate excellence in the recovery of mobile data; then the XRY Advanced Acquisition Certification Training Course is for you. By the end of this course, you will be able to use alternative methods to extract mobile device data and import it into XRY. You will understand how and where data is stored on mobile devices and how to recover that data. training. This is the core certification training that you will need to take in order to make you effective and confident in handling XRY and is the foundation for the next level of forensic courses. We take you through the basics of mobile phone forensic examinations and the necessary principles to recover and preserve data using XRY in the correct manner to ensure safe preservation of data. The course covers all the essentials you will need to get up and running so you can feel confident in your operation of XRY in the early days. The information provided is extensive and covers all aspects of logical examinations of SIM cards, memory cards, feature phones and smartphones, in addition to an introduction to analysis of extracted data using the powerful XAMN Spotlight tool.